Pulse Stressing

In the case of metallized capacitors the user has to give guidelines for the maximum possible pulse stressing because of the limited current capacity of electrodes and contacts.

These guidelines are worked out by means of so-called pulse tests, in which the stress which might occur during application, is simulated.

In a test circuit in accordance with IEC 60384 part 1, the test specimen is charged and then discharged intermittently. The test voltage corresponds to the rated DC voltage and the test comprises 10000 pulses with a repetition frequency of 1 Hz.

The pulse stress capacity is given as pulse rise time in V/µsec. The stipulations for individual capacitor series are in accordance with the CECC type specifications. The rated or operational pulse rise time is specified as 1/10 of the test pulse rise time.

The pulse rise time F given in V/µsec is also indirectly the maximum current capacity.